SKYSCAN 1272 CMOS Edition

High-resolution 3D X-ray Microscopy
 
 

A sharp 3D view of your sample

SKYSCAN 1272 CMOS – High-resolution XRM

SKYSCAN 1272 CMOS Edition builds on the trusted SKYSCAN 1272 desktop X-ray Microscopy platform and incorporates the latest X-ray technologies to bring XRM to the next level.

 

The state-of-art 16 megapixels CMOS X-ray detector provides high-contrast images with superior resolution. The extended detector field of view and enhanced sensitivity for X-rays result in up to twice shorter scan times.

 

The SKYSCAN 1272 CMOS offers automatic selection of parameters with Genius-Mode. Magnification, energy, filter, exposure time and background corrections can all be optimized automatically with a single click.

 

A 16-position sample changer is optionally available for unattended high throughput scanning.

SKYSCAN 1272 CMOS is complemented by 3D.SUITE. This comprehensive software suite covers GPU-accelerated reconstruction, 2D/ 3D morphological analysis, as well as surface and volume rendering visualization.

Key Features

Genius Mode

The SKYSCAN 1272 CMOS offers automatic selection of parameters with Genius-Mode. Magnification, energy, filter, exposure time and background corrections can all be optimized automatically with a single click.

Furthermore, both the sample and large-format CMOS camera can be positioned as close as possible to the source, which substantially increases the measured intensity. That is why SKYSCAN 1272 CMOS scans up to 5 times faster compared to conventional systems with fixed camera position.

Sample changer

SKYSCAN 1272 CMOS can optionally be equipped with an external 16-position sample changer to increase throughput for QC and routine analysis.

The sample changer accepts a variety of sample sizes, up to a diameter of 25 mm.

Samples can be can be easily replaced at any time without interrupting an ongoing scanning process. New samples are automatically detected, and LED‘s indicate the status for every scan: ready, scanning, done.

 

In-situ stages

The Bruker material testing stages are designed to perform compression experiments up to 4400 N and tensile experiments up to 440 N. All stages automatically communicate through the system’s rotation stage, without the need of any cable connections. Using the supplied software, scheduled scanning experiments can be set up.

Bruker’s heating and cooling stages can reach temperatures of up to +80ºC, or 30ºC below ambient temperature. Just like the other stages, no extra connections are needed, and there is an automatic recognition of the stage. Using the heating & cooling stages, samples can be examined under non-ambient conditions, to evaluate the effect of temperature on the sample’s microstructure.